The Microscanning Beam Profiler has been developed for measuring the diameter of laser beams on-line, without introducing any appreciable distortion into the beam. Unique features of the device include its applicability to measuring arbitrarily high power and large area cw laser beams.
Microscanning Beam Profiler can be mounted and stay directly in the beam path during operation of the laser. For laser beams with essentially non-Gaussian profile, Microline will output the beam diameter defined as the size of localization of 86.5% of the total laser beam power. Once calibrated, it also will provide the total power of the beam. |
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