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Microscanning beam profiler
Microscanning beam profiler pictures
The Microscanning Beam Profiler has been developed for measuring the diameter of laser beams on-line, without introducing any appreciable distortion into the beam. Unique features of the device include its applicability to measuring arbitrarily high power and large area cw laser beams.

Microscanning Beam Profiler can be mounted and stay directly in the beam path during operation of the laser. For laser beams with essentially non-Gaussian profile, Microline will output the beam diameter defined as the size of localization of 86.5% of the total laser beam power. Once calibrated, it also will provide the total power of the beam.
Device feature/Model CSX-600HP
Waist measurement range 20 µm – 100 µm
Unfocused beam width measurements range 1 mm – 50 mm
Laser power range 5 W – 100 W
Damage threshold 10 MW/cm2
Power density range > 1 kW/cm2
Wavelength range 0.4 µm – 1.8 µm
Measurement time 20 s
Time between measurements 1 s
Absolute standard error < 5%
Weight 2 kg
Dimensions 30 cm x 6.5 cm x 10.5 cm
Power supply 110 V/220 V
Data acquisition and display Desktop or Notebook
Price $4,900
Lead time 6 – 8 weeks




BEAM Co.,
1300 Lee Road
,
Orlando
,
FL
,
32810
,
USA

Tel. (407) 734-5222
Fax (407) 969-0477
e-mail: sales@beamco.com, info@beamco.com.
http://www.beamco.com/